Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6154712 | Test procedure and test station for carrying out the test procedure | Johann Breu, Ludwig Pirkl, Thomas Wagner, Franz Stegerer, Otto Voggenreiter +3 more | 2000-11-28 |
| 4255675 | Circuit arrangement for reducing the recovery time of a thyristor | Erhard Lehmann, Peter Voss | 1981-03-10 |