MK

Martin Kerber

SA Siemens Aktiengesellschaft: 15 patents #543 of 22,248Top 3%
Infineon Technologies Ag: 14 patents #596 of 7,486Top 8%
IA Infineon Technologies Austria Ag: 3 patents #336 of 1,126Top 30%
MG Med-El Elektromedizinische Geraete Gmbh: 3 patents #46 of 169Top 30%
QA Qimonda Ag: 1 patents #252 of 575Top 45%
SA Seimens Aktiengesellschaft: 1 patents #1 of 69Top 2%
📍 Landeck, AT: #1 of 41 inventorsTop 3%
Overall (All Time): #90,091 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 1–25 of 37 patents

Patent #TitleCo-InventorsDate
11212625 Adaptive noise cancelling of bone conducted noise in the mechanical domain 2021-12-28
9466677 Semiconductor structure including guard ring Matthias Stecher 2016-10-11
9431379 Signal transmission arrangement Jens-Peer Stengl, Uwe Wahl 2016-08-30
9048019 Semiconductor structure including guard ring Matthias Stecher 2015-06-02
8970000 Signal transmission arrangement Jens-Peer Stengl, Uwe Wahl 2015-03-03
8823385 Detection of pre-catastrophic, stress induced leakage current conditions for dielectric layers 2014-09-02
8716832 Semiconductor structure including guard ring 2014-05-06
8620444 Implant sensor and control Martin Zimmerling, Ingeborg Hochmair, Erwin Hochmair, Werner Lindenthaler, Peter Nopp +3 more 2013-12-31
8571673 Energy saving silent mode for hearing implant systems Martin Stoffaneller 2013-10-29
8410575 High voltage semiconductor devices and methods of forming the same Uwe Wahl 2013-04-02
7894240 Method and apparatus for reducing charge trapping in high-k dielectric material Michael Beck, Peter Lahnor, Roland Thewes 2011-02-22
7782074 System that detects damage in adjacent dice 2010-08-24
7772039 Procedure for arranging chips of a first substrate on a second substrate 2010-08-10
7704853 Method for the elimination of the effects of defects on wafers Nikolaos Hatzopoulos 2010-04-27
7652493 Test arrangement having chips of a first substrate on a second substrate and chips of the second substrate on a third substrate 2010-01-26
7550986 Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method 2009-06-23
7403026 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit Thomas Pompl 2008-07-22
6566271 Method of producing a semiconductor surface covered with fluorine Alexander Gschwandtner, Gudrun Innertsberger, Andreas Grassl, Barbara Fröschle, Alexander Mattheus 2003-05-20
6433387 Lateral bipolar transistor 2002-08-13
6404034 CMOS circuit with all-around dielectrically insulated source-drain regions Dietrich Widmann 2002-06-11
6239478 Semiconductor structure for a MOS transistor Udo Schwalke 2001-05-29
6157060 High density integrated semiconductor memory and method for producing the memory 2000-12-05
6124156 Process for manufacturing a CMOS circuit with all-around dielectrically insulated source-drain regions Dietrich Widmann 2000-09-26
6090665 Method of producing the source regions of a flash EEPROM memory cell array 2000-07-18
6027972 Method for producing very small structural widths on a semiconductor substrate 2000-02-22