TI

Toshinobu Ikeda

SC Shincron Co.: 1 patents #17 of 34Top 50%
Overall (All Time): #3,770,441 of 4,157,543Top 95%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5414506 Method of measuring refractive index of thin film and refractive index measuring apparatus therefor Shinichiro Saisho, Akira Odagiri 1995-05-09