Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412761 | Method of controlling the patterned wafer process temperature using the contact type thermometer in the front side of a dummy substrate to accurately measure emissivity in order to perform temperature measurement using radiation thermometer | Takahiro Kitazawa | 2025-09-09 |
| 11761911 | Phantom for evaluating CT device | — | 2023-09-19 |
| 10724971 | Display device and x-ray CT device | Daisuke Harada, Ryo Takahashi, Yasuyuki Keyaki | 2020-07-28 |
| 6577701 | Section reconstruction method and radiographic apparatus | Masaaki Ukita, Taketo Kishi, Eiichi Shintani | 2003-06-10 |