Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6735730 | Integrated circuit with design for testability and method for designing the same | Hideo Fujiwara, Satoshi Ohtake | 2004-05-11 |
| 6334200 | Testable integrated circuit, integrated circuit design-for-testability method, and computer-readable medium storing a program for implementing the design-for-testability method | Hideo Fujiwara, Satoshi Ohtake | 2001-12-25 |