Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9991006 | Asynchronous memory element for scanning | Hiroshi Iwata, Michiko Inoue | 2018-06-05 |
| 6735730 | Integrated circuit with design for testability and method for designing the same | Hideo Fujiwara, Toshimitsu Masuzawa | 2004-05-11 |
| 6633291 | Method and apparatus for displaying an image | Hirofumi Sugitani, Yoshihito Tanaka, Masaaki Yoshikawa, Noritsune Sekiguchi | 2003-10-14 |
| 6334200 | Testable integrated circuit, integrated circuit design-for-testability method, and computer-readable medium storing a program for implementing the design-for-testability method | Hideo Fujiwara, Toshimitsu Masuzawa | 2001-12-25 |