Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7702979 | Semiconductor integrated circuit incorporating test configuration and test method for the same | Masayuki Arai, Kazuhiko Iwasaki, Satoshi Fukumoto, Junichi Nishimoto | 2010-04-20 |
| 7299394 | Method and apparatus for determining optimum initial value for test pattern generator | Ken-ichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Sato | 2007-11-20 |