Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7299394 | Method and apparatus for determining optimum initial value for test pattern generator | Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Takeshi Shoda, Masayuki Sato | 2007-11-20 |