Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9472476 | System and method for test structure on a wafer | Chin Chang Liao, Waisum Wong | 2016-10-18 |
| 8415663 | System and method for test structure on a wafer | Chin Chang Liao, Waisum Wong | 2013-04-09 |