Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9472476 | System and method for test structure on a wafer | Wang Jian Ping, Chin Chang Liao | 2016-10-18 |
| 8415663 | System and method for test structure on a wafer | Wang Jian Ping, Chin Chang Liao | 2013-04-09 |
| 6621320 | Vcc independent time delay circuit | Chaitanya Rajguru | 2003-09-16 |