Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12380326 | Machine learning sparse computation mechanism for arbitrary neural networks, arithmetic compute microarchitecture, and sparsity for training mechanism | Eriko Nurvitadhi, Amit Bleiweiss, Deborah T. Marr, Saritha Dwarakapuram, Sabareesh Ganapathy | 2025-08-05 |
| 12090350 | Fall protection locking assembly, fall protection device and fall protection system | Zizhao LIU, Zhixin Liu, Yongqiang Song | 2024-09-17 |
| 12014265 | Machine learning sparse computation mechanism for arbitrary neural networks, arithmetic compute microarchitecture, and sparsity for training mechanism | Eriko Nurvitadhi, Amit Bleiweiss, Deborah T. Marr, Saritha Dwarakapuram, Sabareesh Ganapathy | 2024-06-18 |
| 11865379 | Linkage operation assembly, fall protection device and fall protection system | Zizhao LIU, Zhixin Liu, Yongqiang Song | 2024-01-09 |
| 11636327 | Machine learning sparse computation mechanism for arbitrary neural networks, arithmetic compute microarchitecture, and sparsity for training mechanism | Eriko Nurvitadhi, Amit Bleiweiss, Deborah T. Marr, Saritha Dwarakapuram, Sabareesh Ganapathy | 2023-04-25 |
| 8942955 | Operationalizing a power usage monitoring system | — | 2015-01-27 |
| 8044668 | Method and system for calibrating measurement tools for semiconductor device manufacturing | Yu-Chu Chen | 2011-10-25 |
| 7989228 | Method and structure for sample preparation for scanning electron microscopes in integrated circuit manufacturing | Xudong Wan, Liqi Guo | 2011-08-02 |
| 7840383 | Operationalizing a power usage monitoring system | — | 2010-11-23 |
| 7831409 | Method and system for yield similarity of semiconductor devices | — | 2010-11-09 |
| 7669197 | Embedded system employing component architecture platform | Patrick O'Neill, Bindu Rama Rao | 2010-02-23 |
| 7447610 | Method and system for reliability similarity of semiconductor devices | — | 2008-11-04 |
| 7321836 | Method for determining the equivalency index of goods, processes, and services | — | 2008-01-22 |
| 7319938 | Method and system for processing commonality of semiconductor devices | Jinghua Ni | 2008-01-15 |
| 7286958 | Method and system for yield similarity of semiconductor devices | — | 2007-10-23 |
| 7076387 | Method for determining the equivalency index of products and processes | Joel L. Dobson | 2006-07-11 |
| 7024334 | Method and system for yield similarity of semiconductor devices | — | 2006-04-04 |
| 7003430 | Method and system for processing commonality of semiconductor devices | Jinghua Ni | 2006-02-21 |
| 6965844 | Method and system for processing stability of semiconductor devices | Jinghua Ni | 2005-11-15 |
| 6850846 | Computer software for genotyping analysis using pattern recognition | Teresa Webster | 2005-02-01 |
| 6789031 | Method for determining the equivalency index of products, processes, and services | — | 2004-09-07 |
| 6167469 | Digital camera having display device for displaying graphical representation of user input and method for transporting the selected digital images thereof | Mohammad A. Safai | 2000-12-26 |
| 5289138 | Apparatus for synchronously selecting different oscillators as system clock source | — | 1994-02-22 |