Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8358144 | Method for manufacturing semiconductor device, semiconductor inspection device, and program including color imaging of metal silicide | Hotaka Maruyama, Kaoru Kato | 2013-01-22 |
| 7842520 | Method for manufacturing semiconductor device, semiconductor inspection device, and program including color imaging of metal silicide and calculations thereof | Hotaka Maruyama, Kaoru Kato | 2010-11-30 |