Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488303 | Replacement blade supplying mechanism | — | 2019-11-26 |
| 10018535 | Thin-slice manufacturing device and thin-slice manufacturing method | — | 2018-07-10 |
| 9983100 | Thin section preparation device | Seigo Murakami | 2018-05-29 |
| 9291532 | Automatic thin section sample preparation device | — | 2016-03-22 |
| 8245613 | Thin-section manufacturing apparatus | Yukimitsu Kijima, Masatoshi Nonoyama | 2012-08-21 |
| 8156853 | Automatic thin-section manufacturing system | Hirohito Fujiwara, Tetsumasa Ito, Koji Fujimoto | 2012-04-17 |
| 8087334 | Sectioning instrument | Tetsumasa Ito, Hirohito Fujiwara, Koji Fujimoto | 2012-01-03 |
| 8074547 | Automatic slicing apparatus | Tetsumasa Ito, Koji Fujimoto | 2011-12-13 |
| 7966091 | Automatic thin-section slides manufacturing system and method | Koji Fujimoto, Tetsumasa Ito | 2011-06-21 |
| 7866464 | Thin-section conveyor apparatus, thin-section scooping tool, and method for transporting thin sections | Koji Fujimoto, Tetsumasa Ito | 2011-01-11 |
| 7802507 | Automatic sliced piece fabricating apparatus and automatic sliced piece sample fabricating apparatus | Tetsumasa Ito, Koji Fujimoto | 2010-09-28 |
| 7616302 | Container for processing section samples, processing method for section samples, and processing apparatus for section samples | Tetsumasa Ito | 2009-11-10 |
| 6740876 | Scanning probe microscope | Akira Egawa, Kunio Nakajima | 2004-05-25 |
| 6710339 | Scanning probe microscope | Akira Egawa | 2004-03-23 |
| 6215121 | Three-dimensional scanning probe microscope | Masamichi Fujihira, Masatoshi Yasutake, Toshihiko Sakuhara, Kazutoshi Watanabe | 2001-04-10 |
| 6094972 | Sampling scanning probe microscope and sampling method thereof | Masatoshi Yasutake, Akira Inoue, Fumiki Sakai, Kazutoshi Watanabe | 2000-08-01 |