Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6798526 | Methods and apparatus for predicting oxygen-induced stacking fault density in wafers | Timothy L. Brown, Dorothy E. Goff | 2004-09-28 |
| 6576501 | Double side polished wafers having external gettering sites, and method of producing same | David Beauchaine, Timothy L. Brown, Sergei Koveshnikov | 2003-06-10 |