Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10470315 | Manufacturing method of test socket and test method for semiconductor package | Daisuke Yamada, Jae-Ho Song, Dong-uhn Shin | 2019-11-05 |
| 9983229 | Test socket for testing semiconductor chip package and method of manufacturing the same | Jong-won Han, Jong Woo Lee, Soon-won Lee, Yong In Lee | 2018-05-29 |