Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10802048 | Universal test socket, semiconductor test device, and method of testing semiconductor devices | Daisuke Yamada | 2020-10-13 |
| 10470315 | Manufacturing method of test socket and test method for semiconductor package | Daisuke Yamada, Jae-Ho Song, Young-gi Min | 2019-11-05 |