Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7240257 | Memory test circuit and test system | Soon-Keun Jeon, Han KIM, Bae-Sun Jun | 2007-07-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7240257 | Memory test circuit and test system | Soon-Keun Jeon, Han KIM, Bae-Sun Jun | 2007-07-03 |