Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7240257 | Memory test circuit and test system | Yong-cheul Kim, Han KIM, Bae-Sun Jun | 2007-07-03 |
| 7134059 | Pad connection structure of embedded memory devices and related memory testing method | — | 2006-11-07 |
| 6247153 | Method and apparatus for testing semiconductor memory device having a plurality of memory banks | Sang Soo Kang | 2001-06-12 |