Woo Jin Kim

Samsung: 38 patents #2,921 of 75,807Top 4%

MO Modne: 19 patents #2 of 12Top 20%

SP Spigen: 17 patents #2 of 12Top 20%

HM Hyundai Motor: 14 patents #743 of 11,886Top 7%

SH Sk Hynix: 9 patents #856 of 4,849Top 20%

KM Kia Motors: 8 patents #631 of 7,429Top 9%

LG: 6 patents #6,917 of 26,165Top 30%

KI Kia: 6 patents #347 of 4,539Top 8%

TI Texas Instruments: 5 patents #2,788 of 12,488Top 25%

KAIST: 4 patents #2,767 of 11,619Top 25%

HU Huvis: 3 patents #5 of 15Top 35%

IC Infac Elecs Co.: 2 patents #3 of 17Top 20%

NO Nox: 2 patents #4 of 14Top 30%

GE Genecraft: 2 patents #4 of 8Top 50%

WC W-Scope Chungju Plant Co.: 1 patents #7 of 16Top 45%

WC W-Scope Korea Co.: 1 patents #7 of 16Top 45%

AM Amazon: 1 patents #10,608 of 19,158Top 60%

MA Mandom: 1 patents #323 of 647Top 50%

RU Research & Business Foundation Sungkyunkwan University: 1 patents #708 of 1,975Top 40%

HC Hyundai Mobis Co.: 1 patents #729 of 1,496Top 50%

SC Stats Chippac: 1 patents #282 of 425Top 70%

📍 Incheon, CA: #4 of 42 inventorsTop 10%

Overall (All Time): #8,770 of 4,157,543Top 1%

127

Patents All Time

Issued Patents All Time

Showing 126–127 of 127 patents

Patent #	Title	Co-Inventors	Date
6342895	Apparatus and method for memory allocation	—	2002-01-29
5940413	Method for detecting operational errors in a tester for semiconductor devices	Joo Suk Kwak, Kyung Wan Kim, Jeong-Ho Bang	1999-08-17