Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298749 | Method and device for predicting defects | Jun Haeng Lee | 2025-05-13 |
| 10949949 | Non-transitory computer-readable medium and method for monitoring a semiconductor fabrication process | Choonshik Leem, Yongdeok Kim | 2021-03-16 |