Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6972422 | Method for measuring particles in glass substrate | Chang Ha Lee, Suk Joon Kim, Ki-Nam Kim, Ga-Hyun Kim, Ji Hwa Jung | 2005-12-06 |
| 6590221 | On-line measuring system for measuring substrate thickness and the method thereof | Jong Eun Ha, Ju Yeol Baek, Jae Seok CHOI, Jang Soo Choi | 2003-07-08 |