Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11639898 | Substrate edge test apparatus, system, and method | Sung Chan HWANG, Tae-ho Keem, SoYoung Song | 2023-05-02 |
| 10732126 | Method and apparatus for inspecting defects on transparent substrate and method emitting incident light | Chong Pyung An, Uta-Barbara Goers, En Hong, Sung Chan HWANG, Tae-ho Keem +8 more | 2020-08-04 |
| 10677739 | Method and apparatus for inspecting defects on transparent substrate | Uta-Barbara Goers, En Hong, Sung Chan HWANG, Tae-ho Keem, Philip Robert LeBlanc +3 more | 2020-06-09 |
| 6972422 | Method for measuring particles in glass substrate | Chang Ha Lee, Taek Cheon Kim, Suk Joon Kim, Ki-Nam Kim, Ga-Hyun Kim | 2005-12-06 |