Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429443 | Scan flip-flop and scan test circuit including the same | Ha-Young Kim, Dal-Hee Lee, Jae Ha Lee | 2019-10-01 |
| 10108772 | Methods of generating integrated circuit layout using standard cell library | Sang-hoon Baek, Jae-Woo Seo, Gi-young Yang, Dal-Hee Lee | 2018-10-23 |
| 9753086 | Scan flip-flop and scan test circuit including the same | Ha-Young Kim, Dal-Hee Lee, Jae Ha Lee | 2017-09-05 |
| 9460259 | Methods of generating integrated circuit layout using standard cell library | Sang-hoon Baek, Jae-Woo Seo, Gi-young Yang, Dal-Hee Lee | 2016-10-04 |