Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10373882 | Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same | Choonshik Leem, Jihye Lee, Deokyong Kim | 2019-08-06 |
| 9991174 | Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same | Choonshik Leem, Jihye Lee, Deokyong Kim | 2018-06-05 |