Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7941714 | Parallel bit test apparatus and parallel bit test method capable of reducing test time | Yong-Hwan Cho, Kwun-Soo Cheon, Hyun-Soon Jang | 2011-05-10 |
| 7746712 | Semiconductor memory device including post package repair control circuit and post package repair method | Jae-Sung Kang, Byung-Heon Kwak, Hyun-Soon Jang, Sang Joon Ryu, Hyun Tae LIM | 2010-06-29 |