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Apparatus and method for package level burn-in test in semiconductor device |
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2003-03-18 |
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Bit line sensing control circuit for a semiconductor memory device and layout of the same |
Yun-Sang Lee, Jae-Hoon Joo, Jong-Eon Lee |
2002-10-29 |
| 6438047 |
Semiconductor memory device and method of repairing same |
Yun-Sang Lee, Jong-Hyun Choi, Kyu-Nam Lim |
2002-08-20 |
| 6240030 |
Integrated circuit devices having mode selection circuits that generate a mode signal based on the magnitude of a mode control signal when a power supply signal transitions from a first state to a second state |
Jung-Hyun Nam |
2001-05-29 |
| 6087887 |
Signal routing circuits having selective high impedance and low impedance output states |
Jong-Hyoung Lim |
2000-07-11 |
| 6081460 |
Integrated circuit devices having voltage level responsive mode-selection circuits therein and methods of operating same |
Jong-Hyoung Lim |
2000-06-27 |
| 4920066 |
Process for fabricating a high-speed CMOS TTL semiconductor device |
Pil-Young Hong, Tae-Yup Oh, Chun Joong Kim |
1990-04-24 |
