Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12136205 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao | 2024-11-05 |
| 11948347 | Fusion model training using distance metrics | Shuhui Qu, Janghwan Lee, Yan Kang, Jinghua Yao | 2024-04-02 |
| 11694319 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao | 2023-07-04 |
| 11435719 | System and method for identifying manufacturing defects | Shuhui Qu, Janghwan Lee | 2022-09-06 |