Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12136205 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Shuhui Qu, Sai MarapaReddy | 2024-11-05 |
| 11948347 | Fusion model training using distance metrics | Shuhui Qu, Janghwan Lee, Yan Kang, Sai MarapaReddy | 2024-04-02 |
| 11694319 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Shuhui Qu, Sai MarapaReddy | 2023-07-04 |