Issued Patents All Time
Showing 1–25 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299296 | Semiconductor memory device and method of adjusting operation condition of the same | Seunghyun Cho, Youngju Kim, Younghwa Kim, Yujung Song | 2025-05-13 |
| 12250807 | Semiconductor device using different types of through-silicon-vias | Jaesan Kim, SeungHan Woo, Haesuk Lee, Youngcheon Kwon | 2025-03-11 |
| 12203980 | Wafer level methods of testing semiconductor devices using internally-generated test enable signals | Ahn Choi | 2025-01-21 |
| 11867751 | Wafer level methods of testing semiconductor devices using internally-generated test enable signals | Ahn Choi | 2024-01-09 |
| 11829224 | Method of operating memory device and memory device performing the same | Dongyeon Park, Youngjae Park, Hyungjin Kim, Jinyong Choi | 2023-11-28 |
| 11681457 | High bandwidth memory device and system device having the same | Jun Gyu Lee, Ki-Heung Kim, Moon Hee Oh | 2023-06-20 |
| 11599301 | Semiconductor memory device and system including the same | Haesuk Lee, Youngcheon Kwon, Beomyong Kil, Jemin Ryu, Jihyun Choi | 2023-03-07 |
| 11538506 | Semiconductor device and semiconductor package including the semiconductor device | Hyungjin Kim, Yongjun Kim, Yonghun Kim, Minsu Ahn, Jinyong Choi | 2022-12-27 |
| 11435397 | Wafer level methods of testing semiconductor devices using internally-generated test enable signals | Ahn Choi | 2022-09-06 |
| 11334282 | High bandwidth memory device and system device having the same | Jun Gyu Lee, Ki-Heung Kim, Moon Hee Oh | 2022-05-17 |
| 11239210 | Semiconductor die for determining load of through silicon via and semiconductor device including the same | SeungHan Woo, Je-Min Ryu, Moonhee Oh, Bumsuk LEE | 2022-02-01 |
| 11194505 | High bandwidth memory device and system device having the same | Jun Gyu Lee, Ki-Heung Kim, Moon Hee Oh | 2021-12-07 |
| 10996885 | High bandwidth memory device and system device having the same | Jun Gyu Lee, Ki-Heung Kim, Moon Hee Oh | 2021-05-04 |
| 10916525 | Semiconductor die for determining load of through silicon via and semiconductor device including the same | SeungHan Woo, Je-Min Ryu, Moonhee Oh, Bumsuk LEE | 2021-02-09 |
| 10768824 | Stacked memory device and a memory chip including the same | Hak-Soo Yu, Je-Min Ryu, Pavan Kumar Kasibhatla, Seok In Hong | 2020-09-08 |
| 10740033 | Memory device sampling data using control signal transmitted through TSV | So Young Kim, Haesuk Lee | 2020-08-11 |
| 10671464 | Memory device comprising status circuit and operating method thereof | Moonhee Oh, Je-Min Ryu, Jaeyoun Youn | 2020-06-02 |
| 10592467 | Semiconductor memory device and method of operating a semiconductor device in a processor mode or a normal mode | Je-Min Ryu, Hak-Soo Yu | 2020-03-17 |
| 10410685 | Memory device for performing internal process and operating method thereof | Je-Min Ryu, Pavan Kumar Kasibhatla | 2019-09-10 |
| 10373661 | Stacked semiconductor device and system including the same | Hae-Suk Lee, Jin-Seong Park, Seung-Han Woo | 2019-08-06 |
| 10331354 | Stacked memory device and a memory chip including the same | Hak-Soo Yu, Je-Min Ryu, Pavan Kumar Kasibhatla, Seok In Hong | 2019-06-25 |
| 10262699 | Memory device for performing internal process and operating method thereof | Je-Min Ryu, Pavan Kumar Kasibhatla | 2019-04-16 |
| 10241150 | Semiconductor apparatus, stack semiconductor apparatus, and test method of the stack semiconductor apparatus | Seung-Han Woo, Hae-Suk Lee | 2019-03-26 |
| 10224114 | Semiconductor device using a parallel bit operation and method of operating the same | Je-Min Ryu, Hak-Soo Yu, Seong-Young Seo, Soo-jung Rho | 2019-03-05 |
| 10083722 | Memory device for performing internal process and operating method thereof | Je-Min Ryu, Pavan Kumar Kasibhatla | 2018-09-25 |