Issued Patents All Time
Showing 51–51 of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6912056 | Apparatus and method for measuring each thickness of a multilayer stacked on a substrate | Pil-Sik Hyun, Sun-Jin Kang, Sang-Kil Lee | 2005-06-28 |
KJ
Kyung-Ho Jung
Dankook University Cheonan Campus Industry Academic Cooperation Foundation: 1 patents #5 of 39Top 15%
Overall (All Time): #52,572 of 4,157,543Top 2%
51
Patents All Time