Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8890067 | Inspection system using scanning electron microscope | Young Gil PARK, Won-Bong Baek | 2014-11-18 |
KO
Ki-Won Oh
Overall (All Time): #3,135,350 of 4,157,543Top 80%
1
Patents All Time