Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8890069 | Method for detecting defect of substrate | Hyung-Seop Kim, Hee-Won Sunwoo, Byoung-Ho Lee, Dong-Chul Ihm, Soo-Bok Chin | 2014-11-18 |
JS
Jong-Cheon Sun
Overall (All Time): #3,135,352 of 4,157,543Top 80%
1
Patents All Time