Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7610530 | Test data generator, test system and method thereof | Young-bu Kim, Du-sik Yoo, Byung-Wook Ahn | 2009-10-27 |
| 7423444 | Digital test apparatus for testing analog semiconductor device(s) | Young-bu Kim, Jung-hye Kim | 2008-09-09 |
| 7268573 | Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test | Young-bu Kim, Jung-hye Kim | 2007-09-11 |
| 6931349 | Jitter measuring system in high speed data output device and total jitter measuring method | — | 2005-08-16 |