Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7610530 | Test data generator, test system and method thereof | Jin-Mo Jang, Young-bu Kim, Byung-Wook Ahn | 2009-10-27 |
| 7138812 | Probe card | Il-Chan Park, Young-bu Kim | 2006-11-21 |