Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10789112 | Device lifespan estimation method, device design method, and computer readable storage medium | Seong Beom Kim | 2020-09-29 |
| 10067813 | Method of analyzing a fault of an electronic system | Byoung Ju Choi, Ji Hyun Park | 2018-09-04 |
| 8680883 | Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same | Yong Sang Cho, Ihl-hwa Moon, Jae-Young Lee, Kyung Hwan Kim | 2014-03-25 |
| 8266572 | Method for acquiring overshoot voltage and analyzing degradation of a gate insulation using the same | Sung-Soo Kim, Man-Young Shin, Sung Eun Kim, Nam Hyung Lee, Yong Sang Cho | 2012-09-11 |