Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8680883 | Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same | Yong Sang Cho, Jang-Hyuk An, Jae-Young Lee, Kyung Hwan Kim | 2014-03-25 |