Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7079237 | Apparatus for inspecting a wafer | Kyung Ho Kim, Yun-Chang Choi, Hye Jung Choi, Sung Uk Park | 2006-07-18 |
| 6898007 | Microscope for inspecting semiconductor wafer | Kyung-Dae Kim, Jin-Sung Kim, Young Goo Lee | 2005-05-24 |