Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835579 | Memory device detecting defect by measuring line resistance of word line | Hwangju Song, Jiseok Lee, Sangwon Hwang | 2023-12-05 |
| 11798645 | Storage device for performing reliability check by using error correction code (ECC) data | Jiseok Lee, Hwangju Song, Namyong Kim, Sangmu Lee, Sangwon Hwang | 2023-10-24 |