Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835579 | Memory device detecting defect by measuring line resistance of word line | Jaeeun YOON, Jiseok Lee, Sangwon Hwang | 2023-12-05 |
| 11798645 | Storage device for performing reliability check by using error correction code (ECC) data | Jiseok Lee, Namyong Kim, Jaeeun YOON, Sangmu Lee, Sangwon Hwang | 2023-10-24 |