Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11727557 | Inspection apparatus for detecting defects in photomasks and dies | Kang-Won Lee, Cheol Ki Min, Jong Ju Park | 2023-08-15 |
| 11353413 | Mask inspection apparatuses and methods, and methods of fabricating masks including mask inspection methods | In-Yong Kang, Il-Yong Jang | 2022-06-07 |
| 11354798 | Inspection apparatus for detecting defects in photomasks and dies | Kang-Won Lee, Cheol Ki Min, Jong Ju Park | 2022-06-07 |
| 10955369 | Mask inspection apparatuses and methods, and methods of fabricating masks including mask inspection methods | In-Yong Kang, Il-Yong Jang | 2021-03-23 |
| 10782254 | Method of detecting a defect and apparatus for performing the same | In-Yong Kang, Jong Ju Park | 2020-09-22 |
| 10726541 | Inspection apparatus for detecting defects in photomasks and dies | Kang-Won Lee, Cheol Ki Min, Jong Ju Park | 2020-07-28 |