Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5917832 | Self-test circuit and method utilizing interlaced scanning for testing a semiconductor memory device | Sanghyeon Baeg | 1999-06-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5917832 | Self-test circuit and method utilizing interlaced scanning for testing a semiconductor memory device | Sanghyeon Baeg | 1999-06-29 |