Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12303307 | Semiconductor device measurement method using x-ray scattering and semiconductor device manufacturing method including the measurement method | Jaeyong Lee, Hidong Kwak, Minjung Shin, Seungryeol Oh, Chuhee LEE | 2025-05-20 |