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MEMS sensor, method for manufacturing the same, and MEMS package including the same |
Goro Nakatani |
2018-11-27 |
| 9925070 |
Hermetically sealed artificial leg |
Yoshiaki Nakaya, Taishiro MISAO, Hiroaki Hashimoto, Nobuyuki Nakamura |
2018-03-27 |
| 9632543 |
Mobile device |
Yuichiro Nakata, Junji Fujino, Yoshitsugu Uedaira, Nobuyuki Yamada, Takeshi Yoshida +1 more |
2017-04-25 |
| 7755001 |
High Cr Ni-based alloy filler material and welding rod for shielded metal arc welding |
Nobutaka Nakajima, Katsuji Dambayashi, Takashi Miyake, Masahiko Toyoda, Seiji Asada +3 more |
2010-07-13 |
| D613275 |
Antenna device |
Takashi Omori |
2010-04-06 |
| 7460414 |
Semiconductor device |
Noriyuki Masago |
2008-12-02 |
| 6791534 |
Trackball units |
Katsuhisa Yamamoto, Masahiro Yokoyama |
2004-09-14 |
| 6646905 |
Ferroelectric storage device |
— |
2003-11-11 |
| 6587374 |
Serial storage device |
Hiroki Takagi, Noriaki Katsuhara |
2003-07-01 |
| 6307777 |
Nonvolatile semiconductor storage device |
Noriaki Katsuhara, Hiromi Uenoyama |
2001-10-23 |
| 6272044 |
Semiconductor storage device and method of driving thereof |
Hiroki Yamamoto |
2001-08-07 |
| 6195285 |
EEPROM device having a constant data writing duration |
Hiroki Yamamoto |
2001-02-27 |
| 6104636 |
Semiconductor memory which can store two or more bits of data in each memory cell |
— |
2000-08-15 |
| 6078529 |
Data storing device |
— |
2000-06-20 |
| 6058040 |
Ferroelectric memory |
— |
2000-05-02 |
| 5986920 |
Ferroelectric memory device and method of reducing imprint effect thereof |
— |
1999-11-16 |
| 5561635 |
PROM IC enabling a stricter memory cell margin test |
Hiromi Uenoyama |
1996-10-01 |
| 5297101 |
PROM IC with a margin test function |
Hiromi Uenoyama |
1994-03-22 |
| 5051911 |
Apparatus for effecting simulation of a logic circuit and method for producing a semiconductor device using the simulation approach |
Masaharu Kimura |
1991-09-24 |