YT

Yoshihiro Tada

Rohm Co.: 14 patents #195 of 2,292Top 9%
FL Furuno Electric Company Limited: 2 patents #137 of 407Top 35%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
Mitsubishi Electric: 1 patents #15,491 of 25,717Top 65%
NA Nabtesco: 1 patents #159 of 320Top 50%
NC Nippon Welding Rod Co.: 1 patents #9 of 40Top 25%
Overall (All Time): #238,349 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10139456 MEMS sensor, method for manufacturing the same, and MEMS package including the same Goro Nakatani 2018-11-27
9925070 Hermetically sealed artificial leg Yoshiaki Nakaya, Taishiro MISAO, Hiroaki Hashimoto, Nobuyuki Nakamura 2018-03-27
9632543 Mobile device Yuichiro Nakata, Junji Fujino, Yoshitsugu Uedaira, Nobuyuki Yamada, Takeshi Yoshida +1 more 2017-04-25
7755001 High Cr Ni-based alloy filler material and welding rod for shielded metal arc welding Nobutaka Nakajima, Katsuji Dambayashi, Takashi Miyake, Masahiko Toyoda, Seiji Asada +3 more 2010-07-13
D613275 Antenna device Takashi Omori 2010-04-06
7460414 Semiconductor device Noriyuki Masago 2008-12-02
6791534 Trackball units Katsuhisa Yamamoto, Masahiro Yokoyama 2004-09-14
6646905 Ferroelectric storage device 2003-11-11
6587374 Serial storage device Hiroki Takagi, Noriaki Katsuhara 2003-07-01
6307777 Nonvolatile semiconductor storage device Noriaki Katsuhara, Hiromi Uenoyama 2001-10-23
6272044 Semiconductor storage device and method of driving thereof Hiroki Yamamoto 2001-08-07
6195285 EEPROM device having a constant data writing duration Hiroki Yamamoto 2001-02-27
6104636 Semiconductor memory which can store two or more bits of data in each memory cell 2000-08-15
6078529 Data storing device 2000-06-20
6058040 Ferroelectric memory 2000-05-02
5986920 Ferroelectric memory device and method of reducing imprint effect thereof 1999-11-16
5561635 PROM IC enabling a stricter memory cell margin test Hiromi Uenoyama 1996-10-01
5297101 PROM IC with a margin test function Hiromi Uenoyama 1994-03-22
5051911 Apparatus for effecting simulation of a logic circuit and method for producing a semiconductor device using the simulation approach Masaharu Kimura 1991-09-24