Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10401310 | X-ray stress analysis apparatus, method, and program | — | 2019-09-03 |
| 9347895 | X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control program | — | 2016-05-24 |
| D750783 | X-ray residual stress measuring instrument | Suguru Sasaki | 2016-03-01 |
| 8953743 | X-ray stress measurement method and apparatus | — | 2015-02-10 |
| 8855266 | X-ray stress measurement apparatus | Tomoyuki Iwata | 2014-10-07 |
| 7342995 | Apparatus for estimating specific polymer crystal | Takahisa Sato, Akihito Yamano, Hiroki Yoshida, Kensaku Hamada | 2008-03-11 |