Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12080858 | Structure for battery analysis and X-ray diffraction device | Koichiro Ito | 2024-09-03 |
| 11635405 | Method for measuring components of biological sample | Shouko Hironaka, Eriko Yoshioka, Daiki Mizuoka | 2023-04-25 |
| 11176918 | Piezoelectric element and musical instrument | Hiroshi Koike, Yutaro SUGAMATA, Seiichiro Iida, Kunio Hiyama, Hidekazu Kodama | 2021-11-16 |
| 10996186 | Method for measuring components of biological sample | Shouko Hironaka, Eriko Yoshioka, Daiki Mizuoka | 2021-05-04 |
| D750783 | X-ray residual stress measuring instrument | Shoichi Yasukawa | 2016-03-01 |
| 9263777 | Semiconductor device, battery pack, and electronic device | Youhei Kawahara, Kenta Kobayashi, Yusuke Sugawara | 2016-02-16 |
| 8890561 | TCP-type semiconductor device and method of testing thereof | — | 2014-11-18 |
| 8310068 | TCP-type semiconductor device | — | 2012-11-13 |
| 8138777 | TCP-type semiconductor device and method of testing thereof | — | 2012-03-20 |
| 7459243 | Method of correcting mask pattern | — | 2008-12-02 |
| 7345498 | Method and measurement program for burn-in test of two semiconductor devices simultaneously | — | 2008-03-18 |
| 7312019 | Linear grating formation method | Satoshi Machida, Takashi Taguchi | 2007-12-25 |
| 7180199 | Semiconductor device and semiconductor wafer | Satoshi Machida, Takashi Taguchi, Noboru Uchida | 2007-02-20 |
| 6999160 | Optimization method of aperture type of projection aligner | — | 2006-02-14 |
| 6989333 | Process for forming a pattern | Minoru Watanabe | 2006-01-24 |