Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7271608 | Prognostic cell for predicting failure of integrated circuits | Bert M. Vermeire, Harold G. Parks | 2007-09-18 |
| 7239163 | Die-level process monitor and method | Jeremy John Ralston-Good, Philipp S. Spuhler, Bert M. Vermeire | 2007-07-03 |
| 6964004 | Method and apparatus for testing a system-on-a-chip | Abhijit Chatterjee, Dave Majernik, Sasikumar Cherubal, Sudip Chakrabarti, Ramakrishna Voorakaranam +1 more | 2005-11-08 |