HN

Hisashi Nakajima

Ricoh Company: 40 patents #359 of 9,818Top 4%
AL A.K. Technical Laboratory: 7 patents #3 of 34Top 9%
TL Tokyo Electron Limited: 7 patents #1,084 of 5,567Top 20%
TL Tokyo Electron Yamanashi Limited: 5 patents #3 of 138Top 3%
JC Japan Crown Cork Co.: 4 patents #9 of 72Top 15%
NC Nippon Paper Industries Co.: 2 patents #176 of 535Top 35%
TC Tomy Company: 2 patents #85 of 226Top 40%
HC Hitachi Koki Co.: 1 patents #557 of 888Top 65%
Overall (All Time): #35,825 of 4,157,543Top 1%
63
Patents All Time

Issued Patents All Time

Showing 51–63 of 63 patents

Patent #TitleCo-InventorsDate
5886488 Swing support apparatus Masashi Shimizu, Kazuhito Yokomori 1999-03-23
5845575 Varnishing film and method of adjusting the surface gloss of prepress color proof using the same Toshikazu Eda, Toshihiko Takada, Kazuo Nagashima, Norio Yabe 1998-12-08
5804983 Probe apparatus with tilt correction mechanisms Haruhiko Yoshioka 1998-09-08
5681520 Method of molding large containers by the process of stretch blow molding Hideaki Koda 1997-10-28
5679306 Method of molding preform in injection stretch blow molding Hideaki Koda 1997-10-21
5642056 Probe apparatus for correcting the probe card posture before testing Haruhiko Yoshioka 1997-06-24
5635226 Composite molding device for stretch blow molding Hideaki Koda, Hisao Yamaguchi 1997-06-03
5620650 Method for injection stretch blow molding of polyethylene Hideaki Koda 1997-04-15
5597525 Method for injection molding polyethylene terephthalate Hideaki Koda 1997-01-28
5594357 Testing apparatus and connection method for the testing apparatus 1997-01-14
5506512 Transfer apparatus having an elevator and prober using the same Noboru Tozawa, Kazuhito Yokomori 1996-04-09
5489853 Testing apparatus and connection method for the testing apparatus 1996-02-06
4875005 Mechanism for turning over a test head of a wafer probing machine Michimasa Terada 1989-10-17