Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9811450 | Semiconductor test apparatus for controlling tester | Yasuyuki Tanaka, Masaru Sugimoto, Kyosaku Nobunaga | 2017-11-07 |
| 9557384 | Testing device | Makoto Nishigaki, Masaru Sugimoto | 2017-01-31 |
| 6930931 | Program counter circuit | — | 2005-08-16 |
| 6802034 | Test pattern generation circuit and method for use with self-diagnostic circuit | Yoshihiro Nagura | 2004-10-05 |
| 6335645 | Semiconductor integrated circuit having built-in self-test circuit | Masami Nakajima, Tetsushi Tanizaki | 2002-01-01 |