Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8145964 | Scan test circuit and scan test control method | — | 2012-03-27 |
| 7941720 | Scan test circuit and scan test control method | — | 2011-05-10 |
| 6236696 | Digital PLL circuit | Yasushi Aoki, Masaki Satoh, Satoko Murakami, Mitsuo Baba | 2001-05-22 |