Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4818334 | Method of etching a layer including polysilicon | Stanley Shwartzman | 1989-04-04 |
| 4386850 | Calibration device and method for an optical defect scanner | — | 1983-06-07 |
ML
Michael F. Leahy
Rca: 1 patents #895 of 1,739Top 55%
Overall (All Time): #2,329,710 of 4,157,543Top 60%
2
Patents All Time